


| Test Procedure | Type | Test Current | Initial State | Tripping or Non-ripping Time Limit | Expected Result | Remark |
| a | B、C、D | 1.13In | cold | t≤1h | no tripping | |
| b | B、C、D | 1.45In | after test a | t<0.1 | tripping | Current in the 5s in the increase of stability |
| c | B、C、D | 2.55In | cold | 15 <t<60s(In≤32A) | tripping | |
| 1s <t<120s(32<In≤63A) | ||||||
| d | B | 3In | cold | t≤0.1s | no tripping | Turn on the auxiliary switch to close the current |
| C | 5In | |||||
| D | 10In | |||||
| e | B | 5In | cold | t<0.1s | tripping | Turn on the auxiliary switch to close the current |
| C | 10In | |||||
| D | 201n |
The terminology “cold state” refes to that no load is carried before testing at the reference setting temperature.
| type | In/A | I△n/A | Residual Current (△A) Is Corresponding To The Following Breaking Time (S) | |||||
| I△n | 21△n | 5l△n | 5A,10A,20A,50A,100A,200A,500A | I△t | ||||
| general type | any value | any value | 0.3 | 0.15 | 0.04 | 0.04 | 0.04 | Max Break-time |
